The oxidation process is performed within the vertical furnace. The furnace temperature is created by three different heaters in three zones using different thermocouples.
The oxidation is performed in different steps:
It is proposed to separate the process in the operations as follows:
PRE-LOADING - Loading wafers to boat
LOADING - Loading boat to furnace
STABILIZATION - Dwelling & Temp increase
OXIDATION - O2 added
UNLOADING - Boat down from furnace
COOLING & WAFERS UNLOADING
SiO2 THICKNESS MEASUREMENT
Effective
Ineffective
Productive
Providing
Corrective
Metrology
Operation Type | Does it increase cost? | Does it increase product value? | Recommendation |
---|---|---|---|
Productive | Yes | Yes | Improve |
Providing | Yes | No | Eliminate |
Corrective | Yes | No | Eliminate |
Metrology | Yes | No | Eliminate |
Operation | Type | Merit | Recommendation |
---|---|---|---|
PRE-LOADING - Loading wafers to boat | Providing | OE 4.43 | Consider eliminating |
LOADING - Loading boat to furnace | Providing | OE 1.73 | Consider eliminating |
STABILIZATION - Dwelling & Temp increase | Corrective | OE 3.1 | Do nothing and eliminate it when possible |
OXIDATION - O2 added | Productive | OE 2.47 | Consider improving |
UNLOADING - Boat down from furnace | Providing | OE 1.8 | Consider eliminating |
COOLING & WAFERS UNLOADING | Corrective | OE 2.67 | Do nothing and eliminate it when possible |
SiO2 THICKNESS MEASUREMENT | Metrology | OE 2.8 | Consider the necessity of the information and eliminate it when possible |
Two operations were found as the most problematic: LOADING and UNLOADING - operations where wafers and the boat are moving within the furnace:
These two operations should be analyzed to find a solution to the problem
The conditions are as follows:
The operation's main purpose is loading the wafers into the boat
Product - Wafers
Effective
Ineffective
Basic functions
Components
Supersystems
Looks like two separate loops: the boat with wafers and the furnace.
Air and N2 flow have no real function.
The conditions are as follows:
The operation's main purpose is to load the boat with wafers into the furnace
Product - Boat
Effective
Ineffective
Basic functions
Components
Supersystems
Looks like a very problematic operation. Moving wafers insert the air residue into the furnace. N2 gas pushes the air residue to the bottom zone.
The cold wafers give the wrong reading to the bottom thermocouple (TC) - cold wafer cools the bottom TC, no correct feedback to the bottom TC because the wafers a moving up, a new cold wafer is coming to the bottom TC, etc. The "wrong information" of the bottom TC leads to the overheating of the bottom zone. After the loading, the bottom zone is overheated and consists of residual air.
The conditions are as follows:
The operation's main purpose is to achieve an equal temperature within the furnace, to keep the wafers at the same temperature.
Product - Wafers within the furnace
Effective
Ineffective
Basic functions
Components
Supersystems
The conditions are as follows:
The operation's main purpose is to create SiO2 layer
Product - SiO2 layer
Effective
Ineffective
Basic functions
Components
Supersystems
The air residue is mainly located in the bottom part of the furnace - low zone are more affected
The conditions are as follows:
The operation's main purpose is to load the boat with wafers into the furnace
Product - Boat
Effective
Ineffective
Basic functions
Components
Supersystems
The conditions are as follows:
The operation's main purpose is loading the wafers into the FOUP
Product - Wafers
Effective
Ineffective
Basic functions
Components
Supersystems
No impact |
Nothing special has been found out. The only small point is the wafers are still hot, and outside air can interact with the wafers that are located within the boat. It is important that bottom-zone wafers will keep the temperature longer than the top-zone wafers because they are more closed to the massive bottom flange.
The thickness of the SiO2 thin film is measured using the ellipsometry method. The scheme of the measurements is shown below (the image was taken from the article):
The purpose of the operation is to generate a signal within the detector.
The product of the operation is the Detector.
Effective
Ineffective
Basic functions
Components
Supersystems
The measurement operations typically are not problematic. Nevertheless, during the measurement operation, functional modeling raised a concern. The quality of the low-zone wafers is different from the mid-zone and top-zone wafers. For instance, the stoichiometry of SiO2 might change. Even small variations of stoichiometry can result in the same change in optical constants that may affect the model of ellipsometric model and result in SiO2 thickness.
So, should be taken into account.
Wet cleaning is widely used in microchip manufacturing. Single wafer equipment is working as follows. A wafer rotates, and chemistry is poured from a movable nozzle. Water rinsing is performed at the end of the process. Loading of a new batch of the chemistry resulted in excursion - a strongly increased amount of defects was observed on the wafer after the processing. The project is dedicated to the failure analysis and creation of innovative solutions.
Semiconductor devices are becoming more complex and expensive. But what exactly are we paying for when we buy a computer, cellphone, or any device containing a microchip? It’s not for radically new functions—the core components remain the same: transistors and interconnections. According to Moore’s law, transistors are getting smaller, with more interconnection layers added, making the manufacturing process longer and more costly. In reality, we’re paying for the inability of engineers to efficiently solve engineering challenges. This project leverages System Functional Modeling (SFM) to analyze the IC interconnection layer and Process Functional Modeling (PFM) to evaluate its manufacturing process. These analyses aim to deepen our understanding of both the device and the production process, generating innovative solutions for cost reduction and improved efficiency.
The project was dedicated to production yield improvement in microchip manufacturing. The bumps are created on the top of a wafer and used for the final test of all dies. Only good dies are taken for the packaging. All dies that fail the test will be scrapped. The process yield depends on the amount of "good" and "bad" dies. It was revealed that in some cases, the time between the end of the process and the final test impacts the yield. The longer the dwelling, the more dies fail the final test. If the dwelling exceeds hundreds of hours, the amount of failed dies becomes dramatically high, which results in the scrapping of the whole wafer. The problem was analyzed and solved.